Used ADVANTEST M 6771AD #293639311 for sale

ADVANTEST M 6771AD handler is an autonomous semiconductor handling system designed to optimize the wafer throughput of test operations. Equipped with high speed motion and advanced acceleration and deceleration control, this system is a powerful and efficient tool for maximizing productivity in the IC test environment. It can accommodate a variety of wafer sizes and types, including round and square wafers, as well as wafer cassette, cassette shelves and devices. ADVANTEST M6771AD handler is designed to provide reliable, high performance and efficient loading and unloading of IC devices into a test station. Its intuitive design provides easy and safe movement of IC devices in and out of the test station. Besides its simple control interface, it includes an onboard scan reader for automated IC device transitioning. The unit is equipped with two types of process control, the dry and wet process cycles. The dry cycle is employed for heat pad heating and cooling, vacuum wafer chuck and wafer positioning. The wet cycle controls the pneumatic cooling and solvent circulation. In addition, the programmed process sequences are stored in the onboard memory and can be modified. M6771 AD also includes a device receptacle for loading/unloading of the ICs into a test bed. It is available with three-fold capability and integrated with a gate valve for MOSFET devices. In addition, an onboard light-weight NC chuck is utilized for automatic centering of the wafer and provides enchanced wafer gripping pressure out of the wafer. The unit is designed to ensure long life, low failure rate and high reliability. It is equipped with a high-precision mechanism for taking into account tolerances of ICs and wafers, resulting in unparalleled device positioning accuracy. It utilizes a double-stage filter for air cleaning of the test bed to minimize the introduction of contaminants. Finally, M 6771AD is designed with an easy-to-use graphical user interface, allowing intuitive command capability and ease of debugging. This robust, versatile and reliable handler is ideal for IC test environments, maximizing throughput and reducing manufacturing costs.