Used ADVANTEST M 6771AD #293669302 for sale

ADVANTEST M 6771AD
Manufacturer
ADVANTEST
Model
M 6771AD
ID: 293669302
Handler.
ADVANTEST M 6771AD is a next-generation handler created by ADVANTEST, a leading provider of automated test solutions. It is designed to meet the needs of testing semiconductor memory and logic chips. ADVANTEST M6771AD is capable of carrying up to 300 lead test and pin-probing tools, making it suitable for X,Y and Z-axis computer-controlled testing. It can be used to test a wide range of technologies, including memory chips, in-circuit testing of logic chips, burn-in testing, wafer testing, chip-level troubleshooting, and more. M6771 AD is equipped with a state-of-the-art tweezers manipulation system for X-Y-Z testing and pin-probing. This helps to ensure precise movements and highly reliable test results. In addition, it is also equipped with an EtherCAT communications standard that makes it easier to connect to external systems, such as a host controller. The handler's simple and intuitive interface makes it easy to navigate and control. The handler also includes several other advanced features, such as an optical defect-inspection camera, a one-key test function, and a barcode scanner. The barcode scanner allows the handler to read the product information easily for traceability and data management. Its optical defect-inspection camera helps to detect subtle material inconsistencies, such as discrepancies in disk surfaces, which can lead to more accurate test results. ADVANTEST M 6771 AD is also equipped with an automatic cable-unloader system to ensure safe and fast cable loading and unloading. In addition, the handler is also designed to meet the needs of aerospace board testing. It is equipped with features such as contact checkers, board temperature monitor, up-down motion alarms, and multi-language support. These features help to ensure thorough, reliable test coverage and provide peace of mind for aerospace board testing. Overall, M6771AD is a powerful, reliable handler capable of efficiently testing a wide range of semiconductor memory and logic chips. It is designed to provide precise testing results and comes equipped with several advanced features, making it ideal for a variety of test applications.
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