Used ADVANTEST M 6771AD #9081737 for sale
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ID: 9081737
Vintage: 2004
Dynamic test handler
(64) Tri-temp
(6) Device bins
JEDEC Input / Output
2005 vintage.
ADVANTEST M 6771AD is a handler for working with large-scale integrated circuits (LSIs) and advanced semiconductor technology. This handler is highly efficient, offering functionality for efficient and accurate testing. It is an easy to use tool and can provide high accuracy measurements. ADVANTEST M6771AD is designed to support high-speed testing of devices in high-density LSIs, such as Surface Mounted Technology (SMT) applications. It offers many advantages over other test equipment. It features a maximum speed of 1000 Test Sites/s, advanced cooling capabilities, high system reliability, and low operating power consumption. The handler features three different test chambers, each of which can be set separately to support currently available wafer types, ranging from 0.2mm to 12mm. The handler also features numerous peripherals, including high-precision ultra low noise coaxial connectors, and support for a wide range of measurements. The advanced test control hardware can support up to 8 parallel ports, allowing multiple test settings and measurements to be taken simultaneously in parallel, enabling high speed and accuracy test results. Furthermore, the low level test control header can support low level RS232 communication for supporting low level input and output data types, such as Edge Address Coding, Up-Down Speed Testing, and more. M6771 AD also features several advanced features, including system synchronization and signal flow control which can be used to optimize performance in all types of workloads. Additionally, it supports low level test software, allowing the device characteristics to be studied in more detail. The handler also offers high performance calibration and software compensation capabilities, as well as a suite of programs designed to provide quick fault detection and deterioration or broken wire detection. Overall, M 6771AD offers reliable, accurate, and easy to use testing capabilities for advanced semiconductor devices. It is a highly efficient tool which can provide high accuracy measurements even for complex devices. This handler is an excellent choice for those looking for an advanced solution for testing and characterization of integrated circuits.
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