Used ADVANTEST M 6771AD #9091969 for sale

ADVANTEST M 6771AD
Manufacturer
ADVANTEST
Model
M 6771AD
ID: 9091969
Vintage: 2005
Dynamic test handler 2005 vintage.
ADVANTEST M 6771AD is a high-performance handler designed specifically for the testing of ICs. The handler is built with an easy to use touch panel user interface and has a programmable test sequence. It is capable of automatically loading/unloading ICs and performing a wide variety of tests. Due to its flexible design, the handler is suitable for almost any IC test requirement. ADVANTEST M6771AD comes equipped with a large-capacity memory and advanced logic capabilities to help improve productivity in a variety of ways. An IC memory cartridge can be used to store test patterns as well as a CSV file containing test data for 28-pin and 48-pin devices. The device is also capable of managing to repair failures by automatically executing retry sequences and re-applying parts with different parameters if required. M6771 AD handler comes with a universal test fixture to handle a wide variety of lead (LQFP144, BGA256, etc.), and uses an enclosure-type platform that maintains a constant pressure to ensure connection and contact. The handler is also designed to ensure accurate positioning, gripping, and contact for a wide variety of IC packages. ADVANTEST M 6771 AD is built to support a variety of tests. It is capable of performing parametric tests such as current and voltage inspection, timing tests, frequency tests, and resistance tests. The device can also perform functional tests with a variety of sequence patterns controlled by three different types of logics. The handler is also capable of executing a wide variety of analog, digital, and mixed-signal tests. In conclusion, M 6771AD is a high-performance, user-friendly device designed for easy IC testing. Its reliable design and versatile capabilities make it suitable for almost any testing requirement. The device's advanced logic capabilities, large IC memory, and functional tests make it an ideal choice for IC testing operations.
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