Used ADVANTEST M 6771AD #9091970 for sale

ADVANTEST M 6771AD
Manufacturer
ADVANTEST
Model
M 6771AD
ID: 9091970
Vintage: 2005
Dynamic test handler 2005 vintage.
ADVANTEST M 6771AD is an IC Handler specifically manufactured to meet the needs of high throughput wafer level production testing. This state-of-the-art Handler offers flexibility, high speed, and a high level of operational reliability. ADVANTEST M6771AD features the ability to handle 5" and 6" wafers, as well as packages up to a size of 28mm square. It has an Open Architecture that supports multiple test recipes, functional test algorithms, and data formats. The Handler also includes a precision cassette indexer, robust wafer clamping/unclamping, an automated die bonder, a wafer color camera and powerful software tools. The Handler uses two models of motion, having two independently driven positioners with orthogonal movement. These positioners allow for fast, accurate, and precise navigation of the result tissue movement. The unit also uses a VacuSeal module to secure wafers in place without filtration or gas exchange. One of the advantages of M6771 AD is its use of an automated die bonder for backside contacts for contact pins and micro bumps. This feature reduces test time and assists in preserving die temperature. The die bonder is able to rapidly attach the contact pin and micro bumps onto the wafer surface. ADVANTEST M 6771 AD also features a 5-axis color camera that uses a focus stacking technology and makes it easier to trace connections between the wafer and the target tweezer probe. This helps to ensure optimum die-to-die contact during the test process. The integrated software allows users to easily manage test recipes, registers, wafer definitions, and multiple gas, voltage and temperature settings. The overall design of ADVANTEST M6771 AD promotes reliability and robustness during the test process. It features several devices that reduce test time and minimize operator burden. This unit is designed for high throughput production testing and offers flexibility, high speed, and accuracy in testing.
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