Used ADVANTEST M 7521 A #155269 for sale

ADVANTEST M 7521 A handler is a wafer handling system designed for inline automated testing of small panels and integrated circuits. It is capable of * pick-and-place * for flipping wafers between two cassettes and * handling * for efficient wafer testing. The handler is capable of *sensing * the wafer and *measuring* the height, width and other parameters of the integrated circuits in order to accurately place them into the test cassette. The handler uses a disk-tape alloy picker mechanism that is durable, reliable and ensures repeatable results. It also incorporates a number of safety features including an air cushion, anti-jam stages and EPC electrode detectors. In addition, the handler is designed with modular components, enabling quick and easy maintenance and upgrade options. M 7521 A handler is equipped with a 4-speed cassette, 8 position floppy drive and a servo controlled picker and placer arm. It is capable of handling wafers up to 16mm in size and transporting them up to 4mm in height. The pick-and-place mechanism uses a vacuum-grabbing system for accurately delivering wafers to the test cassette. This grabber can be adjusted to suit the size, shape and profile of any particular wafer and will ensure that the wafer is securely transported from the drive into the test cassette. In addition, the handler automatically calibrates to worldwide and national standards, including EPC and SMT standards, and supports multiple connection formats, including ATE and EDA. The system is also able to detect and provide feedback on the accuracy of the individual circuits, reducing the likelihood of anomalies. ADVANTEST M 7521 A handler is designed for efficient, automated wafer testing. It is reliable, repeatable, modular and able to be easily maintained. Its pick-and-place mechanism and specialised sensors ensure that it is accurate and able to meet exacting laboratory requirements. With its numerous safety features, calibration options and fast operation, it provides an economical yet dependable way to streamline the wafer testing process.