Used KLA / TENCOR SP1 300DFF1P #9250789 for sale

KLA / TENCOR SP1 300DFF1P is an automated metrology handler optimized for wafer-level inspection and surface quality measurements, allowing measurement and analysis of a wide range of different surfaces and defect types. The handler offers enhanced accuracy, repeatability and throughput thanks to its innovative DFF1 multifunction equipment. Featuring an integrated lightfield flatness measuring cell, this system ensures repeatable, instantaneous, single-point measurements of long-range surface variations typical of many IC wafers. KLA SP1 300DFF1P handler is capable of operating with most wafer sizes and flatness measurement requirements, and is well suited for modern semiconductor line processes. The handler offers precise and repeatable positioning for each metrology task, with a small and precise measurement field of view for analysis of real-time data. The unit is designed with advanced computer-based vision capabilities that allow for non-contact, high-quality visual inspections, as well as up to 30x speed-up of surface analysis and defect detection processes. Additionally, the controller has embedded algorithms to enable improved data analysis, rapid wafer searches, and the ability to trace individual die images. TENCOR SP1 300DFF1P handler is capable of accommodating a wide range of sample and IC packages. The handler can support a variety of test sample types, including wafers, flat panels, PROM devices, PCBs, and other samples commonly used for metrology. To ensure precision and accuracy, the 300DFF1P includes a highly accurate 72 point non-linear nomogram that can be adjusted to suit a range of different IC types and processes. In addition, KLA has incorporated several advanced features in their SP1 300DFF1P handler to improve overall performance. These include an advanced defect detection library, automated characterization capabilities via particle analysis and micro-contouring, air cushion support, and an automated wafer flatness calculation machine. Furthermore, the 300DFF1P integrates a powerful detection and software suite, allowing for additional characterization and analysis of Optical Coherence Tomography (OCT) and image-based surface features. KLA / TENCOR SP1 300DFF1P handler is an efficient and highly repeatable metrology tool specifically designed to measure the surface quality of a wide variety of materials and components. Moreover, its advanced features and capabilities not only increase productivity, but also allow for both fast and accurate data processing. The asset is an ideal solution for those looking for increased accuracy and reliability within their semiconductor processes.