Used MCT 3616E #9111221 for sale

MCT 3616E is a handler designed to increase the throughput of automated test systems while providing reliable operation and high flexibility. The handler is designed to lift and separate devices from a carrier tape, convey them to a test location, verify that the pattern of devices on the tape is the same as the pattern expected by the test equipment, set up the test socket for the device under test, and then transfer the device to the appropriate position for the test. It then picks up the next device on the tape and repeats the process. 3616E incorporates a high reach Z-axis elevator system with integrated X and Y positioning, a servo-controlled pick and place unit, and an articulating tester arm, all designed to work together to provide reliable and efficient operation. It is designed to interface with various test systems, with each function controlled by its own microcontroller. Its brushless DC motors provide a higher level of efficiency, smoother movement, and quieter operation, and its mechanism has been designed to provide a long service life with minimal maintenance. The handler can be programmed with a variety of directions and sequences, allowing for greater flexibility in the placement and acceptance of various components. The handler is also designed to simplify alignment and reduce crosstalk between neighboring devices in a cassette, thanks to its variable pitch registration machine, which is adjustable to correspond to different chip configurations. Additionally, it is equipped with dual vision cameras to provide precise positioning capabilities. MCT 3616E also features an integrated test head cassette that offers greater accuracy in the placement of devices during loading, unloading, and transfer of devices from cassette to test head. Its integrated automation capabilities offer improved safety and traceability for users. 3616E is suitable for use in a wide range of automated test systems, from PoP assemblies to BGA and QFN configurations. Its compact design, versatility, and high performance make it an ideal choice for high-volume, cost-efficient testing of integrated circuits.