Used MCT 4610H #199017 for sale

Manufacturer
MCT
Model
4610H
ID: 199017
Vintage: 1995
Dual Gravity Feed Handler Hot/Cold 208-240 Volts, 50/60 Hz, 25 Amps 1995 vintage.
MCT 4610H is an intelligent handler designed for front end semiconductor testing. It incorporates advanced artificial intelligence and automation to allow for quick, efficient testing of a wide range of semiconductor devices. 4610H handler is a flexible, automated solution for handling different semiconductor products without manual intervention. It is designed to interface directly with wafer probers, tapers, and other test equipment, allowing for quick setup without operators required on site. With up to 20 independent handling zones, MCT 4610H allows for efficient parallel testing of multiple device types on one equipment. The handler utilizes a robust internal chamber design with two independent vacuum systems and 250 mm of X-Y motion. It can handle devices up to 127 mm in diameter, allowing it to process wafers up to 300 mm in size. It also features an integrated peripheral vision camera for accurate device placement for automated test interface and diagnosis. Advanced safety features include an emergency exit system for quick evacuation of test samples, and built-in stress guard unit to protect test samples from overstress. 4610H also comes with a suite of advanced software and analysis tools. Advanced analytics can be used to accurately identify the root cause of test failures and optimize test plans for improved quality control of the product being tested. Advanced reporting tools let the user efficiently report on test results, provide actionable recommendations for further test product refinement or additional samples for further analysis. Real-time feedback on device performance can also be accessed via the machine's remote graphical user interface. In summary, MCT 4610H is a powerful, automated handling solution for testing semiconductor devices. Its robust design, advanced analytics, and integrated peripherals make it ideal for quickly and efficiently testing multiple devices in parallel, saving time and money while providing reliable, quality test results.
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