Used MULTITEST MCT 3608 #293651067 for sale
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ID: 293651067
Handler
Missing parts:
Pwb, Customer interface P/N: 107257 g
Pwb, Motherboard P/N: 107249 k
Pwb, 32 Channel driver P/N: 107832 g
Testsite heater assembly P/N: 113509 c
Testsite solenoid P/N: 114919
Solenoid, intput P/N: 114003.
MULTITEST MCT 3608 is a handler, or testing platform, used to test large-scale semiconductors, such as equipment-in-package (SiP) chips, multi-chip modules (MCMs), and other large integrated circuits. The handler uses a five-camera system, which offers unparalleled imaging and inspection accuracy for challenging test tasks. MCT 3608 is designed to handle large and complex circuits and enable reliable and repeatable test results, effectively replacing manual testing. The handler enables maximum uptime and throughput thanks to its pioneering Type 5 design, which is based on a mechatronic architecture. The Type 5 operator is a three-axis CNC unit, working in conjunction with electric, pneumatic, and vacuum transport systems. It has flexible mounting options, advanced safety features, and increased throughput thanks to the modular dividing gate. MULTITEST MCT 3608 is highly accurate and reliable. Its five-camera machine is critical to the accuracy of the test results, providing defect-free imaging and pinpoint accuracy during inspections. The tool also uses proprietary MULTITEST technology, such as the LIFToption, which ensures that each test contact makes a true connection. Other features include a temperature controller, ventilated temperature chamber, and advanced fault protection. The asset can be configured for different test settings and can be used for everything from prototype testing to production testing. MCT 3608 is designed for easy integration into both manual and automated test systems. It is able to be used with a wide range of technologies, including thermal, electrical, optical, and imaging applications. Its software is also designed to be easily upgraded and adapted to changing requirements. MULTITEST MCT 3608 is an ideal testing platform for large and complex semiconductor tests. It offers unparalleled accuracy, reliable performance, and easy integration into both manual and automated test systems. It is designed for maximum uptime and throughput and its robust design ensures long-term stability and repeatability.
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