Used MULTITEST MT 8503 #293763245 for sale

MULTITEST MT 8503 is a fully automated handler that is used to test integrated circuits and simulates a variety of different test modes. This handler is designed to be both precise and precise, and it can simulate multiple levels of test voltages and currents. It features a high degree of accuracy, enabling it to conduct the most precise tests without sacrificing speed. The handler is a standard thermal platform, and it also features a highly accurate and reliable cold temperature testing platform. The temperature range of the platform is -30°C to +180°C. With the thermal platform, the handler can effectively and simultaneously simulate electrical, thermal, and mechanical tests. The cold temperature testing platform allows for testing of integrated circuit devices in temperatures as low as -50°C. As for electrical testing, MT 8503 can simulate up to fifteen (15) test modes, including DC voltages, AC voltages, currents up to 500mA, plus breakout and resistance tests on SOT and TSSOP packages. The handler also has the capability to simulate a wide range of temperatures, from -50°C to +180°C. The accuracy of the handler is ensured by its precision calibration capability. Additionally, the handler runs on an intuitive graphical user interface (GUI) and is fully scriptable using the embedded command language. The commands can be used to create tests and sequences, as well as customized programmatic tests. MULTITEST MT 8503 handler is fast and reliable, with an average test time of 2.0 sec (at 25°C) per target. It is also flexible in terms of test system configuration, as it includes a fully integrated network of multiple mappers and handlers. This means that multiple handlers can be operating concurrently with minimal interruption. Overall, MT 8503 is an efficient and precise handler, suitable for a variety of integrated circuit testing. Its accuracy is ensured by its precision calibration capability and its robust GUI. It is also highly flexible, versatile, and reliable, with an average test time of 2.0 sec (at 25°C) per target.