Used MULTITEST MT 9308 #293617161 for sale

MULTITEST MT 9308 handler is an advanced semiconductor testing handler used to test wafer die and packaged components during their fabrication process. It is a high throughput, reliable equipment offering a wide range of options for testing in a cost effective manner. The system is designed for ultra-low force, electrically- probed contact, and bonded interconnect systems. It incorporates four component carriers, two sample-servo transport carriers and two electrical test carriers. The component carrier is designed to carry wafer die or packaged components that require test probing and/or TAB attachment. The sample-servo carrier transports wafers for sample motion tasks, including the alignment of contactors onto the dice. The electrical test carrier is capable of executing a variety of electrical tests. The fourth carrier can be used for any of these tasks, as required. MULTITEST MT9308 handler supports a variety of testing programs, including functional digital, analog, and RF. All contactors are low-force air-actuated with a variety of contact configurations. A digital vision unit is included to ensure precise die and component placement and alignment. The handler also features an adjustable-speed measurement machine to ensure accurate test results. The advanced modular design of MT 9308 handler makes it easy to maintain and upgrade, and its flexible configuration allows users to quickly adapt it to accommodate specific test requirements. The tool is also capable of accommodating different test programs, enabling the use of multiple test techniques in a single asset setup. MT9308 handler is equipped with advanced safety and environmental features, including ESD protection, a low-noise acoustic environment, and protection from particulate contamination. The model's software and hardware can be remotely controlled from its own user interface, or through a host computer. MULTITEST MT 9308 handler is a reliable and cost-effective tool for testing wafer die and packaged components. Its advanced design is well suited for rapid, reliable, and precise testing in a variety of semiconductor applications.