Used MULTITEST MT 9918 #293767825 for sale

MULTITEST MT 9918 is a high-performance automated handler designed for testing semiconductor devices such as integrated circuits and discrete components. The technology creates an environment for simultaneous testing of up to two hundred two-leaded device types including bipolar junction transistors, diodes, thyristors and other semiconductor device types. With its advanced robotic operation and programmable options, MT 9918 offers superior flexibility in testing production wafers assembly and other types of semiconductor devices. The core technology behind MULTITEST MT 9918 is the Automated Test Handler (ATH). This automated handling equipment allows for the multi-fingered robot arms to pick and place devices between the Handler and the associated Test System. By combining the speed, accuracy, and repeatability of the robot arms with the precise set-up and control of the Test Unit, MT 9918 can accurately perform high throughput testing of a wide range of semiconductor devices. MULTITEST MT 9918 is made up of three main components: the handler, the test machine, and the power supply. The handler is an automated tool with two robotic arms driven by direct-drive motors, allowing for precise placement and handling of devices over the tester. The two robotic arms can be selective for specific types of devices and can support precise alniment on any substrate of choice. Furthermore, scara robots enable high-speed operation and precise part orientations. The handler also provides a transportation and load-lock asset to achieve process yield and reliability. The test model can be configured as an AC, DC, or DC/AC test equipment and can be customised and programmed through computer-based data entry. The power supply is an integral part of MT 9918 and provides the necessary power to the system during testing. It is specifically designed to the test requirements of the target applications. MULTITEST MT 9918 comes with a number of powerful diagnostic tools, including the Analytical RAM (ARAM), which offers a user-defined parameter file that can be copied to any internal RAM as needed. ARAM is used to analyse and troubleshoot devices and can be used to identify trends and locate defects in semiconductor devices quickly and accurately. Another tool is the Built-in Gate Pulse Checker (GPC) which can measure the speed and power levels of test signals automatically and allow for detailed fault finding when the tester is connected to the target production substrate. Overall, MT 9918 is a state-of-the-art automated handler unit that provides superior testing performance, reliability and flexibility. This machine is suitable for both high-volume and low-volume testing applications, and is designed for the production wafer and device manufacturers. Its automation capabilities and powerful diagnostic tools make this tool capable of testing even the most complex devices quickly and accurately.