Used FEI DualBeam 620 #293765723 for sale

FEI DualBeam 620 is a cutting-edge ion milling system that offers advanced capabilities for precise and high-resolution sample preparation in the fields of materials science, semiconductor manufacturing, and biological research. This powerful instrument combines a focused ion beam (FIB) column with a scanning electron microscope (SEM) column, allowing for versatile imaging and manipulation of samples at the nanoscale level. At the heart of DualBeam 620 is the FIB column, which utilizes a focused beam of gallium ions to selectively remove material from a sample with incredible precision. This milling process can be used for a variety of applications, including cross-sectioning, thinning, polishing, and patterning of samples for analysis under the SEM column. The ion beam can be finely controlled to remove material layer by layer, enabling users to create precise structures and features on their samples. The SEM column in FEI DualBeam 620 provides high-resolution imaging capabilities, allowing users to observe the surface morphology and structure of their samples in great detail. The SEM imaging mode can be seamlessly integrated with the FIB milling mode, providing real-time feedback on the milling process and enabling users to accurately target specific areas of interest on the sample. This integration of imaging and milling functionalities makes DualBeam 620 an invaluable tool for conducting complex material characterization and analysis. One of the key strengths of FEI DualBeam 620 is its ability to perform in-situ sample manipulation and analysis. Users can easily switch between imaging, milling, and analysis modes without removing the sample from the instrument, minimizing sample handling and reducing the risk of contamination. Additionally, DualBeam 620 is equipped with advanced automation features and user-friendly software interfaces, making it easy for researchers to perform complex experiments and achieve reproducible results. The instrument also offers a range of advanced imaging and analytical techniques, including energy-dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). These techniques enable users to obtain elemental composition information and crystallographic data from their samples, providing valuable insights into the material properties and microstructure. FEI DualBeam 620 is equipped with a variety of sample manipulation tools, such as in situ lift-out systems, micromanipulators, and gas injection systems, allowing for precise control over the sample handling process. These tools enable users to extract samples for further analysis, deposit protective coatings, or perform nanoscale modifications on the sample surface. In conclusion, DualBeam 620 ion milling system is a state-of-the-art instrument that offers unmatched capabilities for sample preparation, imaging, and analysis in a wide range of scientific disciplines. With its high-performance FIB and SEM columns, advanced automation features, and versatile sample manipulation tools, FEI DualBeam 620 is an indispensable tool for researchers seeking to push the boundaries of nanoscale research and technology development.