Used FEI DualBeam 820 #9215632 for sale

FEI DualBeam 820 is an advanced ion milling equipment designed for the high-performance preparation of material surfaces. The system is capable of precise ion milling of a wide range of material surfaces including brittle, hard-to-machine surfaces such as ceramics, metal alloys, and glass. DualBeam 820 utilizes Ga imaging and broad range gallium ion beam deposition to achieve features of milling that are on the scale of nanometers. This allows for close, precise ablation when processing delicate surfaces. This unit utilizes a stationary substrate holder to ensure reliable handling of material surfaces during milling. The holder is able to rotate for easier navigation of the ion beam and articulating stages to ensure precise functioning. This advanced holder design ensures high-precision milling results even when handling delicate samples. The machine is also enclosed in a vacuum chamber to minimize the effects of debris expansion and environmental contamination during operation. FEI DualBeam 820 is one of the few advanced ion milling systems that can be used for both planar and profiled milling operations. For planar milling, a precise 3-axis motorized stage allows for uniform ablation and accurate speed adjustment. The profiled milling capability allows for a controlled control of the ion beam to shape intricate features and depths. Additionally, an independent beam deflection tool is available to accommodate different types of milling needs. DualBeam 820 has two independently operated ion beam sources for both Ga imaging and broad range gallium ion beam deposition. This allows for precise control and optimization for different milling operations. The Ga imaging asset is able to capture the topography of delicate surfaces and features to detect any damage or contamination. The gallium ion beam enables high-precision ablation process to create intricate features on the material surface. FEI DualBeam 820 can be used with many different materials, including metals, glass, ceramics, and composites. It also provides a comprehensive suite of milling process controls and monitoring features for comprehensive process validation and monitoring. Additionally, the advanced software suite from FEI makes it easy to monitor milling activity for a more customized milling experience. Overall, DualBeam 820 is an advanced ion milling model designed for accurate milling of material surfaces. The equipment is enclosed in a vacuum chamber and includes a stationery substrate holder, precise 3-axis stage, beam deflection system with independently operated beams, and a comprehensive software suite for comprehensive milling and monitoring. The unit is efficient at creating intricate features with great precision and speed.