Used FEI DualBeam 835 #293594852 for sale

FEI DualBeam 835 is an advanced ion milling equipment that offers a unique range of capabilities for nanoscale surface analysis. This versatile instrument integrates an FIB (focused ion beam) system and SEM (scanning electron microscope) column, enabling precision surface modification, high-resolution imaging and detailed elemental analysis. The FIB component of DualBeam 835 is capable of sputter etching, deposition, and electron beam lithography. These capabilities enable operators to mill and shape materials with nanometer accuracy, while providing insight into the materials properties and microstructures at the nanoscale. The integrated SEM component provides operators with the ability to image milled surfaces with up to 5 nm lateral resolution and perform additional characterization such as chemical and electrical measurements. FEI DualBeam 835 features a high-voltage chamber with a sample chamber pressure of 10-6 Torr, visible laser alignment for precise sample positioning , and a dual-action gas injection unit for precise gas control. Its advanced source control machine allows for precise adjustment of the beam's energy along with the ion beam diameter and current settings. These features, coupled with its robust software package, provide users with detailed control and flexibility for a wide range of ion milling applications. DualBeam 835 is an ideal choice for researchers, manufacturers, and engineers who require advanced ion milling capabilities and detailed characterization of materials at the nanoscale. With integrated FIB and SEM components, this instrument is able to provide users with reliable and repeatable results with a minimal amount of time and effort.