Used FEI DualBeam 835 #293606223 for sale
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ID: 293606223
Scanning Electron Microscope (SEM)
Peripherals / Accessories:
Monitor
CPU
Keyboard
Mouse.
FEI DualBeam 835 is a high-performance ion milling equipment designed for a wide range of materials characterization and nanofabrication applications. The system combines scanning electron microscopy (SEM) and focused ion beam (FIB) technologies, enabling precise imaging and nanofabrication. The unit is equipped with a high-resolution FEI Schottky field emission gun. The gun promises optimum performance with high resolution imaging and low beam spot size. A low-energy backscattering detector is also included for phase contrast imaging. For nanofabrication, DualBeam 835 is equipped with a gallium Focused Ion Beam (FIB) machine. The tool is designed to allow precise and accurate milling of materials in order to observe nano-scale features and to expand the capabilities of materials characterization. The asset is compatible with a variety of ion species, allowing the user to select the correct beam type depending on the material and application. The beam current is adjustable from 10 pA up to 300 nA. FEI DualBeam 835 offers advanced sample manipulation, including high vacuum stages, two 2-axis sample stages, and two cavities accommodating up to two samples, maximizing sample throughput and reducing set-up time. The exchange time for SEM and FIB, as well as sample changing time can be minimized by the automated cavity exchange capability. The model has powerful software for collaboration, analysis and characterization. The user-friendly software offers an intuitive graphical user interface and automated workflows for enhanced efficiency and reproducibility. FEI Helios Synthesis™ software enables users to perform automated milling functions and extract data from the FIB channel. The software also includes a Nanoscopy module for obtaining precise 3D images of nanoscale structures. DualBeam 835 optimizes both imaging and nanofabrication, making it an ideal tool for a variety of materials characterization and nanofabrication applications. The combination of SEM and FIB technologies, precise sample manipulation, compatibility with a variety of ions, advanced software, and the high performance of the Schottky field emission gun make the equipment an invaluable tool for scientific research and experimentation.
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