Used FEI DualBeam 835 #9285511 for sale

FEI DualBeam 835 is an ion milling equipment designed to provide a high resolution imaging solution for nanoscale materials research. This dual-beam imaging system combines a focused ion beam and a scanning electron microscope to provide sub nanometer resolution capabilities. It is ideal for a wide array of applications, such as 3D surface atomic resolution surface imaging, 3D subsurface imaging, surface voltage mapping, quantitative elemental analysis, ion sputter depth profiling, crystal structure analysis and transmission electron microscopy. DualBeam 835 unit consists of an ion column and a scanning electron microscope (SEM or EDX). The ion column is comprised of an ion source, beam optics, and focusing elements. A dual beam technique is employed, combining both high energy ion extraction, and lower energy electron beam activation to effectively process complicated structures. The high energy material ejection facilitates well-defined bulk structures, providing accurate 3D surface topography and high-resolution imaging at an atomic scale. The SEM portion of the machine allows for the analysis of materials in situ. The interaction between the electron beam and an object under test will produce secondary electrons, which provide insight into the materials being studied. These electrons are detected by the tool and analyzed via secondary electron detection. FEI DualBeam 835 asset also annotates and image process improvements over the previous model, FEI 831. The model significantly improves the field of view from low to subnanometer resolutions. Its dual-beam approach also yields better contrast and image clarity on the most complicated of structure. This imaging equipment is loaded with various features such as the dual-beam profile adjustment tool that increases accuracy and resolution. Furthermore, DualBeam 835 is controllable via a graphical user interface, which allows for easier system control and operation. Overall, FEI DualBeam 835 is designed to provide high resolution imaging solutions to nanoscale materials research. This powerful unit features dual-beam technology, providing a superior imaging experience, with improved resolution and contrast, as well as improved annotation and image processing capabilities. With a user friendly graphical user interface, the ion column and the scanning electron microscope can be easily operated and controlled.