Used FEI DualBeam 865 #9076200 for sale

FEI DualBeam 865 ion milling equipment is an advanced, highly precise technique used to prepare and analyze materials at a very high level of resolution. This system combines advanced focused ion beam (FIB) milling technology with scanning electron microscope (SEM) imaging capabilities. DualBeam 865 is designed for a wide range of applications, such as thin film deposition, nanostructure fabrication, and precise 3D sample milling. The FIB milling technique used in FEI DualBeam 865 enables the removal and deposition of materials at the nanoscale using a flux of high energy ions. The ions are focused through a motion-stabilized electron optics unit to provide extremely fine spatial resolution. The ions also have the ability to penetrate material surfaces and into structures with extreme depths for precise 3D milling. In addition, DualBeam 865 is capable of carbon infiltration and 3D chemical imaging, which allows researchers to view a sample in three dimensions with unprecedented clarity. The scanning electron microscopy (SEM) imaging capabilities of FEI DualBeam 865 allow researchers to monitor the milling process in real time at a very high level of magnification. The nano-sized features on the sample surface can be detected and analyzed with both secondary and backscattered electrons for a range of applications. DualBeam 865 is also equipped with an ultrasonic transducer that generates high-frequency vibrations to aid in sample cleaning and deburring. The versatile design of FEI DualBeam 865 allows precise control over the milling and imaging process. The machine has a wide array of sample exchange holders to accommodate the range of materials used in various research applications. In addition, the tool allows for the convenient positioning of milling accessories like micropens and end mills. The high-precision control of the FIB and SEM systems enable DualBeam 865 to provide researchers with unparalleled insight into the microstructure of their samples. FEI DualBeam 865 greatly improves upon traditional ion milling systems, offering an advanced, highly precise technique for sample preparation and analysis. The combination of FIB and SEM capabilities makes DualBeam 865 an invaluable tool for materials researchers. The asset's highly precise sample milling and imaging capabilities enable researchers to analyze materials at a level of detail hitherto unavailable.