Used FEI Helios NanoLab 400 #9262998 for sale
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ID: 9262998
Wafer Size: 12"
Vintage: 2009
Focused Ion Beam (FIB) system, 12"
Elstar FEG Electron column: 350 V - 30 kV
In-lens SE
BSE Detector
Elstar electron column (Sub-nanometer)
Sidewinder ion column: 30 kV
Milling power: 21 nA Beam current
CDEM With 5 nm image resolution
Windows OS and FEI UI
TSS Networking computer
Five-axis motorized compucentric stage with load lock
Specimen coverage (Diameter): 100 mm
Load lock
Chamber scope for real time observation
Vacuum system:
Oil free consisting (3) IGP
Air cooled turbo
Dry PVP
GIS installed: W and IEE
Does not include support PC
2009 vintage.
FEI Helios NanoLab 400 is a high-precision ion milling equipment that has been designed for both physical and life science applications. It is an advanced tool for nanostructuring, ultramicrotoming, and surface analysis. The system is capable of removing material atom by atom, layer by layer, and has a sample transfer unit, enabling high-precision micromachining and reconditioning of a wide variety of materials. Helios NanoLab 400 is equipped with a specialized nanomilling gun that uses a beam of gallium ions to focally mill down material from surfaces. The machine has an automated "smart-sizing" feature that keeps the beam diameter of the ion beam small, allowing it to tackle ultra-fine structures. It also features a beam blower that can control milling speed and prevent clogging of the gun. The beam blower can also be used to create nanostructures on various substrates. The tool also features a high-resolution 5-axis manipulator that allows for precise positioning and milling of samples. An automated sample recognition asset ensures that the beam is properly positioned for optimal milling accuracy. Further, FEI Helios NanoLab 400 features a field enhanced ion source, ensuring uniform milling over large areas. The model has a unique imaging capability, allowing for the creation of high-contrast images of the milling operation. In addition to the physical capabilities of the equipment, Helios NanoLab 400 is equipped with an advanced control system which allows users to easily create customized milling programs. An onboard database stores milling parameters, allowing for repeatable and accurate results. The unit is designed for easy operation and maintenance, with automated systems that can quickly and efficiently clean and change components. Its intuitive graphical user interface and detailed user manuals enable users to easily set up and operate the machine, allowing for maximum productivity. Overall, FEI Helios NanoLab 400 offers a comprehensive, feature-packed tool for precision nanostructuring and surface analysis. Its automated micromachining capabilities provide users with repeatable and accurate results, while its intuitive user interface and automated systems simplify operation and maintenance, allowing users to maximize their productivity.
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