Used FEI Helios NanoLab 400 #9262998 for sale

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Manufacturer
FEI
Model
Helios NanoLab 400
ID: 9262998
Wafer Size: 12"
Vintage: 2009
Focused Ion Beam (FIB) system, 12" Elstar FEG Electron column: 350 V - 30 kV In-lens SE BSE Detector Elstar electron column (Sub-nanometer) Sidewinder ion column: 30 kV Milling power: 21 nA Beam current CDEM With 5 nm image resolution Windows OS and FEI UI TSS Networking computer Five-axis motorized compucentric stage with load lock Specimen coverage (Diameter): 100 mm Load lock Chamber scope for real time observation Vacuum system: Oil free consisting (3) IGP Air cooled turbo Dry PVP GIS installed: W and IEE Does not include support PC 2009 vintage.
FEI Helios NanoLab 400 is a high-precision ion milling equipment that has been designed for both physical and life science applications. It is an advanced tool for nanostructuring, ultramicrotoming, and surface analysis. The system is capable of removing material atom by atom, layer by layer, and has a sample transfer unit, enabling high-precision micromachining and reconditioning of a wide variety of materials. Helios NanoLab 400 is equipped with a specialized nanomilling gun that uses a beam of gallium ions to focally mill down material from surfaces. The machine has an automated "smart-sizing" feature that keeps the beam diameter of the ion beam small, allowing it to tackle ultra-fine structures. It also features a beam blower that can control milling speed and prevent clogging of the gun. The beam blower can also be used to create nanostructures on various substrates. The tool also features a high-resolution 5-axis manipulator that allows for precise positioning and milling of samples. An automated sample recognition asset ensures that the beam is properly positioned for optimal milling accuracy. Further, FEI Helios NanoLab 400 features a field enhanced ion source, ensuring uniform milling over large areas. The model has a unique imaging capability, allowing for the creation of high-contrast images of the milling operation. In addition to the physical capabilities of the equipment, Helios NanoLab 400 is equipped with an advanced control system which allows users to easily create customized milling programs. An onboard database stores milling parameters, allowing for repeatable and accurate results. The unit is designed for easy operation and maintenance, with automated systems that can quickly and efficiently clean and change components. Its intuitive graphical user interface and detailed user manuals enable users to easily set up and operate the machine, allowing for maximum productivity. Overall, FEI Helios NanoLab 400 offers a comprehensive, feature-packed tool for precision nanostructuring and surface analysis. Its automated micromachining capabilities provide users with repeatable and accurate results, while its intuitive user interface and automated systems simplify operation and maintenance, allowing users to maximize their productivity.
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