Used FEI Helios NanoLab 450 #293647270 for sale

FEI Helios NanoLab 450 is a dual-beam focused ion beam-scanning electron microscope equipment (FIB-SEM) engineered specifically to perform ion milling. The FIB-SEM is capable of performing precise nano-scale modifications with high-resolution imaging to provide a detailed three-dimensional chemical, physical, and topographical analysis of materials. Helios NanoLab 450 is designed to serve materials science and engineering research in areas such as semiconductor device fabrication, failure and reliability analysis, and scientific imaging. It is an ideal tool for characterizing nanomaterials such as thin films, carbon nanotubes, metal nanowires, or quantum dots. It is also a powerful tool for nanofabrication applications, allowing users to produce high-precision structures on the scale of nanometers. The system consists of several main components: a dual-beam FIB-SEM, a gas injection unit that uses senter gas ions to perform milling operations, and a flightpath and imaging column. The latter includes an electron detector, an ion detector, and a heating/cooling stage. The FIB-SEM employs a combination of ion beam lithography and imaging techniques to obtain detailed information about the structure of the target material. This enables the precise processing, imaging, and analysis at the nanometer scale. The gas injection machine is used to introduce various gases into the focused ion beam to mill the sample. Gas ions can be used to strip off atoms from the target material in order to create a desired structure or pattern. The gas injection pressure can be adjusted for different milling speeds. This process offers good degree of control and flexibility, allowing users to accurately produce high-resolution nanostructures on a variety of materials. The imaging column of FEI Helios NanoLab 450 provides excellent imaging resolution and contrast levels. It also has a heating/cooling stage that enables users to study the material properties in a wide range of temperatures, providing useful data for further research. Overall, Helios NanoLab 450 is an advanced and versatile FIB-SEM tool that offers precise nano-scale modification and high-resolution imaging capabilities. It is an invaluable tool for researchers involved in studying materials and fabricating nanomaterial structures.