Used FEI / MICRION 9500 EX #9383328 for sale

Manufacturer
FEI / MICRION
Model
9500 EX
ID: 9383328
Focused Ion Beam (FIB) system Stage type: 200 mm x 200 mm Load lock system IBM RISC System 6000 43P 140 Computer MCP Detector I-Gun type: column 5 nm Beam current: 3 pA - 931 pA (50 kV) Depo system: Tungsten Tmcts O2 H2O Cl2 / Br2 XeF2 Vacuum pump: Turbo molecular pump (2) Mechanical pumps (2) Ion getter pumps.
FEI / MICRION 9500 EX is an advanced ion milling equipment designed for preparing large samples for analysis by transmission electron microscopy (TEM). The ion milling system is ideal for users requiring unsurpassed performance, precision, stability, and convenience. FEI 9500 EX can accommodate large samples, up to 6" in diameter. Its large sample size allows for milling of larger regions of interest (ROI) in one step. MICRION 9500 EX also has a 'spin-etch' feature, which allows for fast etching of a larger sample, up to 3.6" in diameter. 9500 EX features an ergonomic design, offering superior comfort during milling processes. Its tilting and removable chamber allows easy access to samples, making it easy to set up and dismantle the unit for milling different sizes and types of samples. FEI / MICRION 9500 EX is designed using a sophisticated inertial focusing technology, with a state-of-the-art negative ion source. This advanced technology provides superior performance and stability, offering the user the most precise and accurate results. The sophisticated inertial focusing machine also features advanced beam control and multiple beam monitoring technologies, allowing the user to precisely align the beam and adjust focus for maximum sample preparation. The integrated magnification and image capture tool facilitates automated continuous imaging and focusing. This feature allows the user to automatically adjust focus and collect high-resolution images of the samples along the milling process. The automated imaging systems also troubleshoot any potential issues with the ion beam during the milling process. To ensure maximum safety and prevent sample contamination, FEI 9500 EX features an integrated pumping asset with an advanced gas-flow model. This equipment works by extracting air-borne particles from the milling chamber, protecting the sample from further contamination. MICRION 9500 EX offers a variety of ion beam options, from broad beam ions (E-Beam) to focused beam ions (FIB). A wide range of ion currents is available, providing the user with an increased level of precision and accuracy during the milling process. 9500 EX is also certified by the CE mark for use in Europe and other international markets. Overall, FEI / MICRION 9500 EX is an advanced ion milling system designed for precise sample preparation for TEM. Its advanced technologies, large sample size, and automated imaging unit make it the ideal choice for researchers requiring unsurpassed performance and convenience.
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