Used FEI Strata FIB 205 #9293814 for sale

FEI Strata FIB 205 is a dual-beam, ion milling equipment that enables precision sectioning and imaging of a wide range of materials. This system is specifically designed to provide automated, high-accuracy cross-sectional samples for advanced lithography, electron spectroscopy, nanoanalytical sample preparation, materials characterization, failure analysis, and research applications. The unit includes an ion beam, a focused ion beam (FIB) column, and an optional high-resolution field emission scanning electron microscope (FESEM) for correlated imaging. The ion beam source in Strata FIB 205 is a focus-type ion gun featuring a high-energy, gallium-based liquid-metal ion source. With a beam current up to 2.5 mA, a refined beam of Ga ions propagates through a channeled crystal monochromator, providing a bundle of ions of desired energy and chemical makeup. This electron-optically focused beam further passes through an electrostatic pocket lens for fine beam manipulation. The FIB column has a piezoelectric x-y stage for nanoscale lateral control and a quartz z stage for precise vertical control of the sample. It is integrated with a three-axis automated stage, enabling multi-site, multi-level directional milling and precise positioning of the sample within the milling chamber. For high-resolution imaging, a fully-enclosed, vibration isolation table combines with an automated sample chuck, sliding seal, low-theta detector and low-background backscatter detector for SEM imaging and EDX analysis in a single platform. The FIB column has two scanning modes for automated 3D FIB milling, namely, Backscatter and Secondary Electron Imaging (SEI). Both backscatter and SEI modes benefit from the focused ion beam allowing for microns and nanometers to milling precision, respectively. FEI Strata FIB 205 offers high throughput with increased accuracy with up to 10nm resolution and minimal sample damage. The automated machine also enables high flexibility, allowing researchers to move from one material to another without compromising on performance. With the rapid breakthrough in material science and nanotechnology, this cutting-edge tool provides a tool to make a significant contribution to the advancement of these fields.