Used GATAN 600TMPA #9072826 for sale

GATAN 600TMPA is an advanced ion milling equipment designed to provide controlled removal of materials from delicate samples. This system is capable of delivering high resolution milling to a depth of 100nm with a very even surface finish. 600TMPA unit utilizes specialized ion beam sputter technology to mill sample materials, ultimately creating a smooth milled surface. The ion beam operates at a specific energy level, typically in the range of 20 - 30 keV. This process is highly accurate and allows for targeted removal of materials while maintaining the structural integrity of the sample. The machine includes an atomic force microscope (AFM) with a custom vacuum tool and a digital image processing analysis program that provides detailed information about the sample profile. AFM can measure surface topography from heights of 0.3 nm to 20 μm with 0.1nm resolution. High resolution mapping of the sample surface facilitates accurate preparation of the sample for further analysis. GATAN 600TMPA is composed of several different parts that include an ion beam source, a dedicated vacuum chamber, and a controller to adjust the operating parameters. The ion beam source is responsible for emitting a beam of ions which are then directed towards the sample and are responsible for material removal. The dedicated vacuum chamber is required for containing the asset components away from unwanted particulates and enables the operation of the ion beam at a low pressure. The controller is used to precisely adjust the energy, power, and beam current while allowing manual intervention during the milling process. Special software is available to control the milling process and create a data log of the steps taken while the sample is being prepared. This provides valuable information that can be used to fine-tune the milling process and facilitate the transition to the next step in the experiment. In summary, 600TMPA is a precision milling model that enables efficient and accurate material removal from delicate samples. It uses advanced ion beam technology to precisely target the material to be removed and enables high resolution milling to a depth of 100nm. Comprehensive software is available to facilitate the control of the milling process and provide detailed data analysis.