Used GATAN 626 #293807575 for sale

GATAN 626 is a high-performance equipment for ion milling that utilizes a single-ended, RF-biased, magnetically shielded, stainless steel vacuum chamber. The system provides nanometer-scale surface processing in a clean and inert atmosphere. The high sputter rate of 626 leads to fast processing of samples. The unit utilizes a singly-ended beam machine with a field plate geometry which utilizes focused ion beams for sputtering of a broad range of materials. An additional feature of GATAN 626 is the "dither tool", which enables the active compensation for sample tilting and for the accuracy of final ion milling results. 626's high precision operation is ensured through the innovative control asset that provides a minimal beam deflection and beam current profile due to active thermal management within the ion beam pathway. This control model combats issues such as gas ion gauging or false gas measurements that often cause undesired conductivity on the milled sample surface due to high-energy ion bombardment. This removal of conductivity is key for certain types of processing of samples as it drastically reduces the mortality rate of radiation damage or chemical contamination. GATAN 626 utilizes ion optics and lenses to manage the beam current and beam deflection. These lenses are able to move the ion beam from the sample plane to the ground plane, which helps minimize surface profile deviation and therefore can yield high quality patterns. Additionally, 626 is equipped with a sample chuck that employs a static pre-ion milling mode for even removal of the target tissues to help prevent cross-amplitude interference. Ultimately, GATAN 626 is a high performance, cost-effective equipment for ion milling. It offers a number of features that enables it to achieve accurate results in a clean and inert atmosphere. The high-precision control system ensures a minimal beam deflection and beam current profile as well as minimal surface profile deviation. The dither unit further improves accuracy by compensating for sample tilting. The sample chuck provides good pre-ion milling mode to help prevent cross-amplitude interference. Taken together, 626 is an ideal solution for nanometer-scale surface-processing.