Used GATAN 643 #9035828 for sale

GATAN 643
Manufacturer
GATAN
Model
643
ID: 9035828
Single holder tilt with faraday cage, hexring type Fits most JEOL TEM's Can also be used as a single tilt holder.
GATAN 643 ion milling equipment is a tool used primarily for preparing highly conductive specimens for transmission electron microscopic examination. It works by using a beam of high energy ions to sputter away the top surface of a specimen, creating a highly smooth, conductive, and uniform surface for analysis. The system includes an ion source, an beam-scattering shield, and a single anode/sample stage. The ion source of 643 is designed to generate an intense beam of ions, which are then directed into the specimen. The unit typically incorporates a three grid assembly, with each grid further equipped with an independent set of blades that can be used to manipulate the direction of the beam. Ion beam scattering shields are also used to protect the chamber walls from the potentially damaging effects of the directed ion beam. The sample stage of the machine can be configured in one of two ways. The first allows for direct ion bombardment, which is achieved by positioning the sample in the beam's path and allowing it to be powered by the ion beam itself. The second configuration uses a secondary anode to power the specimen, which gives the user the ability to control the beam's intensity and the area of the sample to be etched. GATAN 643 leverages modern ion milling technology to create highly uniform and thin surface sites for the examination of specimens with near atomic level resolution. The tool has precise control over the durability of the surface layers and, with the help of its independent grid sets, it is capable of producing very precise specimen preparation results. Additionally, the asset is designed to level high aspect ratio specimens, allowing for greater analysis precision. The consistent and uniform surface achieved by the model ensures repeatable and reliable results that form the foundation of high resolution electron microscopy and other nanoscale imaging techniques.
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