Used GATAN 645 #9271289 for sale

Manufacturer
GATAN
Model
645
ID: 9271289
Precision dual ion milling system With ALCATEL / ADIXEN / PFEIFFER 3008A vacuum pump Manual included.
GATAN 645 is an ion milling equipment designed to aid in electron microscopy specimen preparation. The system utilizes a beam of energetic ions to cut away surface material from a sample, allowing researchers to get a closer look at the remaining layers. This technique enables the imaging of features too small or delicate to be observed otherwise. The unit is reliable, consistent, and cost-effective, providing results with high accuracy and minimal data loss. 645 utilizes a high voltage source to generate the ion beam, which is then focused down to a very small area at the sample surface. Variable electrostatic lenses are used to manipulate the beam to the desired shape and size, yielding a wide range of cut depths which can be adjusted according to the user's needs. The machine also features a built-in environmental chamber designed to keep the specimen at a consistent temperature during the milling process. GATAN 645 provides a very high degree of control over the milling process. The intensity and angle of the beam can be adjusted with great precision, allowing for more complex and faster milling operations. Additionally, the tool is designed to optimize the number of ions that reach the target surface, helping to avoid over-cutting and preserve finer details in the specimen. 645 supports a wide range of ion sources, such as Ar+, Cs+, and Ne+, and can be used with a variety of sample materials including metals, semiconductor materials, and glass. Furthermore, the asset is equipped with several safety features, as well as built-in diagnostics and automatic shutoff in the event of a problem. Overall, GATAN 645 is an effective and reliable choice for electron microscopy specimen preparation. It provides a great deal of control and accuracy, as well as minimizing data loss and waste. The model is a cost effective solution for researchers who need to image features under the surface of a sample accurately and accurately.
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