Used LAM STRATA-GX #293609733 for sale

LAM STRATA-GX is an ion milling equipment designed to help scientific researchers obtain high quality samples of materials on the nanoscale. It is a versatile tool that can be used to perform a variety of tasks, including sectioning and preparing specimens for electron microscopy, nanoprobing, and failure analysis investigations. At the heart of STRATA-GX ion milling system is its focused ion beam. This beam, generated by an advanced ion gun, is directed on a targeted sample material via a set of lenses and apertures, allowing for the creation of finely detailed cross-sections of materials. The collision of the beam with the sample surface causes atoms to be removed in a process known as "sputtering." Using the unit, the user can precisely control the milling rates and ion beam intensities to obtain cross-sections with controlled thickness and uniform surfaces. The machine also features a uniquely designed view-screen mask and an automated stage, allowing for greater precision and consequent increases in accuracy and sample quality. The tool is easy to use and requires minimal user interaction. All settings can be adjustable with smooth control knobs, as well as via a graphical user interface. Additionally, the asset includes integrated software for mechanical specimen preparation and scanning electron microscope imaging. Extensive safety measures have been built into LAM STRATA-GX model to ensure safe handling of the sample during the milling process. The equipment is equipped with a secondary port for a vacuum chamber, increasing the safety of working with wet samples. Furthermore, the chamber features a low-vacuum hold harmless system to ensure that any misdirection of the beam is contained. The unit is designed to be quick and reliable. The milling procedure takes minutes rather than hours, enabling higher sample throughput. The ion beam is highly stable, which minimizes the need for re-tuning and allows for repeatable results. STRATA-GX ion milling machine is designed to offer the highest degree of accuracy and repeatability in specimen preparation while ensuring user safety and minimal downtime. It is ideal for applications such as sample preparation for electron microscopy, nanoprobing and failure analysis investigations.