Used PHILIPS / FEI DB 830 #293812504 for sale

Manufacturer
PHILIPS / FEI
Model
DB 830
ID: 293812504
FEG Focused Ion Beam (FEG-FIB) system.
PHILIPS / FEI DB 830 ion milling equipment is a sophisticated tool used in material science and microscopy for precision material removal and surface analysis. Ion milling is a process that involves bombarding a sample with high-energy ions to remove material in a controlled and precise manner. FEI DB 830 system is designed to provide high-quality ion milling for various applications such as cross-section analysis, material thinning, and surface modification. The ion source of PHILIPS DB830 unit generates a beam of ions, typically argon or gallium ions, accelerated to high energies using an extraction electrode and an accelerating voltage. These high-energy ions are then directed towards the sample surface, where they interact with the material, causing sputtering and etching. The ion beam can be controlled in terms of beam current, energy, and angle of incidence to achieve the desired milling results. One of the key features of PHILIPS / FEI DB830 machine is its ability to provide precise and uniform ion milling across the sample surface. This is achieved through advanced beam scanning and beam shaping technologies that ensure even material removal and consistent results. The tool also offers a range of milling parameters that can be optimized for different sample materials and applications, allowing researchers to tailor the milling process to their specific needs. DB830 asset is equipped with advanced vacuum systems to create a low-pressure environment around the sample, which is essential for efficient ion milling. The high vacuum conditions prevent contamination and unwanted chemical reactions during the milling process, ensuring clean and accurate results. The model also features built-in safety mechanisms to protect the user and the equipment from potential hazards associated with ion beam operation. In addition to ion milling, DB 830 equipment can be used for ion beam deposition, ion beam lithography, and other surface modification techniques. The system offers flexibility in terms of sample handling and control software, allowing users to perform a wide range of experiments and analyses with ease. The unit is also compatible with various analytical techniques such as scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) for comprehensive sample characterization. Overall, FEI DB830 ion milling machine is a versatile and powerful tool for material analysis and surface modification in research and industrial settings. Its high precision, reliability, and advanced features make it an indispensable tool for scientists and engineers working in fields such as materials science, nanotechnology, and semiconductor research.
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