Used PHILIPS / FEI DB235 #293616080 for sale

Manufacturer
PHILIPS / FEI
Model
DB235
ID: 293616080
Vintage: 2002
Scanning Electron Microscope (SEM) (2) GIS Detectors: SED, TLD, CDEM, STEM 2002 vintage.
PHILIPS / FEI DB235 is an ion milling equipment designed for precision surface polishing (or "sputtering") for microelectronic components. This milling system utilizes a highly focused ion beam to remove micro-scale defects from the surfaces without damaging the underlying substrate material. The ion beam is generated by an ion source, which is coupled to a vacuum chamber. In order to control the size and shape of the ion beam, an adjustable aperture plate is installed at the entry of the vacuum chamber. The ion beam is focused and directed by a series of lenses, creating a fine beam with a diameter of typically 5 microns or less. With this equipment, parts can be milled with a precision accuracy to within 1 micron or better. The programming of the milling unit allows users to adjust the depth of the sputtering, the direction of the ions and the speed of the sputtering. It is possible to adjust the milling conditions so that fine or coarse polishing can be achieved. Additionally, on FEI DB235 machine, the ion source power can be adjusted to vary the beam energy to accommodate different substrates and patterns of defect removal. The tool is equipped with a number of safety features. A safety shutter ensures that the beam is not active when it is not in use. An automated cleaning asset within the chamber periodically scrubs the inner surfaces, ensuring that contamination is not easily transferred to the components during the milling process. PHILIPS DB 235 model is ideal for many microelectronic applications, including the production of high density integrated circuits and MEMS. This equipment has proved to be a cost-effective solution for precision milling and surface polishing, so it can be used in both research and industrial contexts.
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