Used PHILIPS / FEI DB235 #293617170 for sale

PHILIPS / FEI DB235
Manufacturer
PHILIPS / FEI
Model
DB235
ID: 293617170
Scanning Electron Microscope (SEM).
PHILIPS / FEI DB235 is an advanced Ion Milling Equipment that is widely used in the semiconductor industry for device preparation, thinning, and profiling. The system utilizes broad ion beam sputtering to provide nanometer-level precision etching, as well as enable precise control and profiling of the devices' surfaces. This unit helps enable highly precise ion milling and testing of silicon devices, as well as other materials. FEI DB235 is an advanced ion beam milling machine, built around the company's proprietary FEI I-Beam tool. It has a highly advanced ion beam sputter—an Argon and Oxygen sourced, optically corrected ion beam sputter—which provides for fast, controlled, and precise material removal with up to 500 nm depth resolution. This high-performance asset also comes with a variety of beam options for a wide range of materials, making it suitable for applications ranging from deep etching to resist removal. The model also provides precise control over removal of deep and ultra-deep features with high accuracy. Furthermore, precise control over nano-scaled features can also be achieved, including line/space or hole sizes down to 1 nm. It also has an extensive range of command and control options to enhance its performance, helping investigators achieve a high-resolution, high-fidelity etch of their targets. In addition to its precise material removal capabilities, PHILIPS DB 235 also comes with a powerful imaging and analysis suite, complete with a wide assortment of tools that further enhance its precision control. The equipment is also equipped with a variety of accessories, such as a glass chamber, stage adapter, and hardware pumps. The hardware pumps are used to pump out contaminants during operations and also to remove any heat load buildup after an etch. Overall DB235 is a powerful, high-precision milling system that enables the precise control and profile of materials. It comes with advanced features, including a ion beam sputter, precision control, imaging, and analysis tools, that allow for optimal processes when etching and testing materials. Its range of command and control options, as well as its accessories, make it a reliable and efficient tool used for ion milling.
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