Used PHILIPS / FEI Nova NanoLab 600i #293799586 for sale
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ID: 293799586
Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
Gas injection system for deposition: SiO2, Pt
Manipulator resolution
Transmission Electron Microscopy (TEM) sample kit
PC.
PHILIPS / FEI Nova NanoLab 600i is a cutting-edge ion milling equipment designed for advanced materials analysis and nanofabrication applications. This powerful instrument offers superior performance and versatility in precision nanofabrication processes, making it an essential tool for researchers and engineers in the fields of nanotechnology, materials science, and semiconductor manufacturing. The system features a sophisticated ion beam column that generates high-energy ion beams for precision milling, etching, and deposition processes at the nanoscale level. This enables the manipulation and modification of materials with high precision and control, allowing for the creation of intricate nanostructures and patterns with sub-nanometer resolution. One of the key features of FEI Nova NanoLab 600i is its advanced imaging capabilities, which include high-resolution scanning electron microscopy (SEM) and focused ion beam (FIB) imaging. These imaging modalities provide detailed insight into sample topography, composition, and structure, allowing for real-time monitoring and analysis of milling processes. The unit is also equipped with energy-dispersive X-ray spectroscopy (EDS) for elemental analysis and mapping of samples, further enhancing the analytical capabilities of the instrument. The ion milling machine is capable of precise material removal and thinning with high throughput, making it ideal for a wide range of applications such as sample preparation for transmission electron microscopy (TEM), device prototyping, circuit editing, and failure analysis. The tool offers a variety of ion beam species, including gallium (Ga), neon (Ne), and xenon (Xe), allowing for tailored milling processes to suit specific material properties and requirements. PHILIPS Nova NanoLab 600i is equipped with advanced automation and software control features that enhance user convenience and workflow efficiency. The asset includes intuitive software interfaces for easy parameter setup, recipe development, and data analysis, streamlining the experimental process and facilitating quick and reproducible results. Additionally, the instrument offers automated stage navigation and sample handling capabilities, enabling high-throughput processing of multiple samples with minimal user intervention. Moreover, the ion milling model is designed for versatility and adaptability, with customizable configurations and accessories to meet diverse research needs. Optional features such as in-situ lift-out systems, gas injection systems, and cryogenic sample holders expand the functionality of the instrument and enable a broader range of applications in nanofabrication, device characterization, and materials research. In conclusion, Nova NanoLab 600i ion milling equipment represents a state-of-the-art solution for advanced materials analysis and nanofabrication tasks. With its advanced ion beam technology, high-resolution imaging capabilities, automation features, and customizable configurations, this instrument provides researchers and engineers with a powerful tool for pushing the boundaries of nanoscience and technology.
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