Used PHILIPS / FEI Nova NanoLab 600i #293808611 for sale

PHILIPS / FEI Nova NanoLab 600i
ID: 293808611
Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Platinum gas Omniprobe Sirion UHR E Column Magnum ion column Beam current: Up to 20 nA.
FEI Nova Nanolab 600i is a dual beam focused ion beam-scanning electron microscope (FIB-SEM) ion milling equipment that enables advanced sample preparation techniques to be performed. The system combines the power of an ion beam at a low voltage, with the flexibility of a scanning electron microscope. This unit allows for precise control and analysis of the physical structure and chemical composition of materials both in their natural state and when subjected to manipulation. The instrument design combines both a high resolution focused ion beam column, with a scanning electron microscope column within one machine. This provides a unique capability to accurately mill away material layer by layer, and then analyse the results with a high resolution microscope. The tool contains a gallium ion source with a sample and acceleration potentials of 0-10kV, and a spot size of 1 and 5 nm for low and high resolution imaging respectively. The secondary electron detection is equipped with an energetic neutral atom (ENA) detector and an extended range backscattered detector. The ion milling asset is equipped with an array of advanced features. The automated milling sequence, for example, allows for fine control and precision in the milling process, enabling easy layer-by-layer sample preparation. The computer-controlled stage and ion/SEM probing enable exquisite detail to be gathered about the specimen, with a high degree of accuracy. Different levels of sensitivity can be controlled, allowing for targeted sample preparation. Nova Nanolab 600i is a powerful and versatile ion milling model that enables the preparation of samples for further analysis and study. With the ability to analyse samples at a high level of detail, both physically and chemically, FEI Nanolab 600i provides an excellent option for the study of nanomaterials and other complex specimens. Its automated functions provide accurate control over the parameters of the milling process, allowing for the milling of delicate and precious materials in an efficient and controlled manner. This can enable a range of experiments to be undertaken, producing valuable insights into the properties and behaviours of materials.
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