Used THERMO FISHER SCIENTIFIC / FEI Helios NanoLab 1200 Plus #293826965 for sale

THERMO FISHER SCIENTIFIC / FEI Helios NanoLab 1200 Plus is a cutting-edge ion milling equipment that is specifically designed for high-resolution imaging and precision fabrication applications in the field of nanotechnology. This advanced instrument combines state-of-the-art technologies to deliver exceptional performance and versatility for a wide range of research and development needs. At the heart of the NanoLab 1200 Plus is its ion milling capability, which enables the precise removal of material from a sample surface using focused ion beams. The system is equipped with a high-energy ion source that can generate ion beams with sub-nanometer resolution, allowing for ultra-precise milling and patterning of nanoscale features. This capability is essential for applications such as sample preparation for transmission electron microscopy (TEM), nanostructuring, device prototyping, and material modification. The ion milling process on the NanoLab 1200 Plus is controlled and monitored through an intuitive user interface that provides real-time feedback on milling parameters, beam position, and sample surface topography. This advanced control unit enables users to achieve highly reproducible results and fine-tune the milling process to meet specific requirements for each application. Additionally, the machine is equipped with advanced imaging capabilities that allow for in-situ monitoring of the milling process, ensuring precise control and alignment of the ion beam. In addition to its ion milling capabilities, the NanoLab 1200 Plus features a versatile sample handling tool that supports a wide range of sample sizes and types. The asset can accommodate samples up to 150 mm in diameter and 25 mm in height, making it suitable for a variety of applications across different research fields. The sample stage is equipped with multiple degrees of freedom, allowing for precise positioning and alignment of the sample with respect to the ion beam. This flexibility is essential for achieving accurate and uniform milling across the entire sample surface. Furthermore, the NanoLab 1200 Plus is equipped with a range of advanced imaging and analysis tools that enable comprehensive characterization of samples before and after ion milling. The model features a high-resolution scanning electron microscope (SEM) for imaging surface morphology at nanoscale resolution, as well as an energy-dispersive X-ray spectroscopy (EDS) equipment for chemical composition analysis. These capabilities allow users to perform detailed analysis of the sample structure, composition, and morphology, providing valuable insights into the effects of ion milling on the material properties. Overall, FEI Helios NanoLab 1200 Plus is a state-of-the-art ion milling system that offers unparalleled performance and flexibility for a wide range of nanotechnology applications. With its advanced capabilities, intuitive user interface, and comprehensive analysis tools, the NanoLab 1200 Plus is an indispensable tool for researchers and engineers working in the fields of materials science, nanotechnology, semiconductor device fabrication, and beyond.