Used AMETEK INSPECT F FEG-SEM #9276757 for sale

AMETEK INSPECT F FEG-SEM is a field-emission gun scanning electron microscope (FEG-SEM) from AMETEK INSPECT, a division of AMETEK, Inc. The FEG-SE is an analytical instrument commonly used for materials science research, nanotechnology, semiconductor device inspection, failure analysis, and reverse engineering. The FEG-SEM enables the user to inspect samples at high resolution down to the sub-nanometer level. INSPECT F FEG-SEM is a table top instrument that is capable of both high resolution investigations with low beam currents and large field of view high current imaging. This equipment features an integrated vacuum system with a nanosecond high speed switching valve and an active vacuum gauge, designed to ensure optimal vacuum conditions. The FEG-SEM is equipped with an UltraBright FE Schottky field emission gun for high resolution imaging and an in-column detector for automated imaging. In addition, the standard sample chamber is designed to facilitate rapid exchange of specimens with the use of an automated loading mechanism. AMETEK INSPECT F FEG-SEM provides several automation features such as automatic eucentric height adjustment and unbiased sample transfer for high throughput imaging. The unit is equipped with signal processing to increase image fidelity, including auto gain, auto contrast, flat field correction, and digital image filtering. Furthermore, the FEG-SEM includes several post-processing aids such as area reconstructions and detector calibration. The FEG-SEM is designed with various safety precautions, including an Emergency Stop switch and interlocking door switches. An interactive Graphical User Interface (GUI) simplifies operation and data acquisition. Additionally, the modular machine allows the user to configure components, such as detectors and specimen loader, to their specific application. INSPECT F FEG-SEM is designed to provide users with a reliable, versatile and affordable scanning electron microscope for a variety of applications. The range of technical capabilities, precision and accuracy, makes the FEG-SEM an ideal tool for materials science research, nanotechnology, semiconductor device inspection, failure analysis, and reverse engineering.