Used EDAX / AMETEK Inspect S #9301224 for sale
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ID: 9301224
Vintage: 2007
Detector microanalysis system
PN: PV77-60680-ME
Port: Back left upper
Active area: 10 mm²
Amplifier model: 204 B+
Window type: 3.3
2007 vintage.
EDAX / AMETEK Inspect S is a comprehensive equipment used in the lab for materials analysis. This system includes advanced imaging and precision analysis capabilities to address various challenges in material analysis. It offers a wide range of analysis capabilities, such as elemental mapping, surface topography, chemical and structural characterization, and time-of-flight (TOF) sputter depth profiling. The unit is designed to support both light and heavy element materials analysis. EDAX Inspect S features a full range of imaging, characterization and analysis capabilities, including scanning electron microscope (SEM) imaging, energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD) analysis, and electron probe microanalysis (EPMA). With an EDS detector, it is also possible to detect light elements such as carbon and nitrogen, making it ideal for materials analysis for many application fields. The machine includes an advanced data management tool that allows for the efficient storage, management and sharing of analysis data. The asset also includes a user-friendly graphical user interface (GUI) for easy control and monitoring of the analysis process. A powerful software suite, including dedicated software for analysis functions, is also included. In addition to its analytical capabilities, the model also includes an automated sample loading and unloading equipment, which is designed to improve sample throughput. The automated loading and unloading system also simplifies the process of preparing samples and helps to minimize user interactions. The unit is designed to enable accurate, high-precision measurements, with a resolution of down to 3 nanometers in either secondary or backscattering imaging modes. It also features a high-temperature EBSD mode, allowing the machine to be used to study the microstructures of high-temperature materials. The tool also features a fully automated particle analysis capability, allowing for the automatic detection, sizing and identification of particles. This can be used for a variety of materials, such as ceramics, minerals, and plastics. Finally, the asset is equipped with self-diagnostic capabilities, allowing the model to continuously monitor its operation and alert users to errors or anomalies. This self-diagnostic feature allows users to quickly address any issues as they arise. Overall, AMETEK Inspect S is a comprehensive equipment for lab materials analysis, offering a wide range of imaging, characterization and analysis capabilities, and self-diagnostics for quick problem solving. It is ideal for use in the lab for a variety of materials analysis applications.
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