Used METTLER TOLEDO AG 104 #9100638 for sale

METTLER TOLEDO AG 104 is an advanced laboratory equipment and accessories including the Autoanalysis Genetics Analyzer, X-Ray Photoelectron Spectrometer, Atomic Force Microscope and X-Ray Fluorescence Analyzer. This lab automation accessory equipment is designed for users who need to perform high quality sample analysis. With the help of this system, a variety of laboratory processes are automated with a minimum of downtime. This lab automation unit can be used to control and manage the entire cycle of sample development from reception, preparation and analysis. AG 104 is equipped with cutting-edge technology to deliver accurate and reliable data in the shortest time possible. It features the exclusive Inscriptio Templates technology that enables the speedy creation of presets for rapid set-up. It also provides a versatile software environment with graphical interfaces to customize the user experience. In addition, the machine provides a user-friendly library of data extraction rules, methods and data storage formats. The Autoanalysis Genetics Analyzer is featured on METTLER TOLEDO AG 104. It is designed to identify and analyze genetic material using a combination of optical scanning, Radial Chromatographic Print-Scan™, and differential scanning fluorimetry. The tool can detect a wide range of markers including single nucleotide polymorphism (SNP), indels, repeat sequence, microorganism sequence, and DNA sequence. In addition, the asset can produce comprehensive, detailed genetic reports. The X-Ray Photoelectron Spectrometer (XPS) built into the model is used to study the chemistry of solid surfaces. This powerful device can be used to analyze both precoated and exposed surfaces of a specimen. XPS enables the measurement of core electrons, valence band and secondary electrons. This equipment also allows users to scale measurements to the electron volts or wavenumbers of the XPS spectrum. The Atomic Force Microscope (AFM) feature on this system enables researchers to observe microscopic features with nanoscopic details. AFM can collect topographical data of items such as proteins, molecules, and nano particles. The unit also includes an X-Ray Fluorescence Analyzer (XRF) to detect the elemental composition of materials. The XRF allows researchers to make contaminant and impurity analysis of a range of substances. AG 104 delivers exceptional automation and product quality control capabilities. With its comprehensive features and user-friendly software the machine provides users with a highly efficient laboratory automation solution. Its powerful Autoanalysis Genetic Analyzer, X-Ray Photoelectron Spectrometer, Atomic Force Microscope and X-Ray Fluorescence Analyzer provide accurate and reliable data for a wide variety of applications.