Used LTX-CREDENCE / COHU Equipment for sale

LTX-Credence, now known as Cohu, is a leading semiconductor test solutions company with a rich history and a reputation for offering cutting-edge products. Their products are widely used in the final testing stage for a range of complex semiconductor devices. Founded in 1976, LTX Corporation was one of the early pioneers in developing innovative test equipment for the semiconductor industry. The company made significant advancements and gained a strong reputation for its functional test systems and production interface solutions. In 2013, LTX Corporation merged with Credence Systems Corporation to form LTX-Credence Corporation. LTX-Credence continued to innovate and offer solutions that address the challenges faced by semiconductor manufacturers. They provided Test Standard Language (TSL) software, allowing seamless integration and improved operational efficiency. In 2014, LTX-Credence merged with XCerra Corporation to expand its product portfolio and customer base. In 2018, LTX-Credence underwent a major transformation and rebranded itself as Cohu. The new name reflected the company's commitment to producing market-leading products that deliver maximum value to its customers. Cohu extended their product offerings beyond test equipment to address the evolving needs of the semiconductor industry, including handling solutions and software platforms for both front-end and back-end applications. Cohu's final test products provide comprehensive solutions for device testing, including RF, system-on-a-chip (SoC), and power management integrated circuits. Their advanced techniques and methodological approaches ensure high-throughput testing and optimal yield. Moreover, Cohu's collaborative approach with their customers enables them to deliver solutions tailored to specific needs and specifications. With a solid history of innovation and a diversified product range, Cohu continues to play an integral role in the success of the semiconductor industry by enabling efficient, reliable, and accurate final testing of semiconductor devices.