Used ACCRETECH / TSK Rondcom 40C #9189680 for sale

ACCRETECH / TSK Rondcom 40C is an automated non-contact mask and wafer inspection equipment. It is designed to inspect all types of wafer types, and produce a highly accurate, 3-dimensional image of the surface of the material. Utilizing a combination of advanced optical inspection and hardware, TSK Rondcom 40C can detect defects, foreign particles, and other surface anomalies that would not be picked up by other systems. ACCRETECH Rondcom 40C has a vacuum chamber with a viewable area of approximately 200 x 250 mm. Inside this chamber is a high-power laser source, which illuminates the wafer surface and is focused onto a CCD camera at an adjustable angle of view. The image from the camera is then processed by a powerful high-resolution imaging system, enabling it to detect very small defects and even particles down tofive microns in size. The unit features a range of parameters that can be adjusted to match the material and application. These include the selection of either backlight or frontlight imaging, as well as the selection of any of four preset illumination angles. This allows Rondcom 40C to detect defects and particles in even the most difficult to inspect surfaces. The imaging machine also allows the user to select any number of zoom levels, ranging from up to 200x magnification at full resolution. ACCRETECH / TSK Rondcom 40C also features an automatic defect classification tool that uses unique algorithms to quickly and accurately classify any defects that are detected. This asset is able to distinguish between elements such as scratches, pits, and foreign particles and can provide a detailed description of each. Additionally, the software is able to keep a permanent record of all images that it captures and is able to export them in multiple formats. TSK Rondcom 40C is a reliable and efficient model that can provide highly detailed images of the wafer surface, enabling users to detect and classify defects with unsurpassed accuracy. With its user-friendly controls and sophisticated imaging equipment, this system is an ideal choice for conducting detailed wafer inspections.