Used ACCRETECH / TSK Win-Win 50-1600 #9353791 for sale

ACCRETECH / TSK Win-Win 50-1600 is a highly advanced mask and wafer inspection equipment designed to meet the needs of today's modern semiconductor manufacturing. It can simultaneously perform the following tasks: mask inspection, wafer inspection, metrology, and defect inspection. TSK Win-Win 50-1600 utilizes Modulated Bright Field Inspector (MBI) technology for optical mask inspection that provides up to 10 x 10nm3 resolution capabilities. The MBI system allows even smaller, high-end semiconductor components to be inspected up to 4x faster than conventional mask inspection platforms while providing ultra-low-noise imaging that offers better detection of even the smallest defects. The unit's wafer inspection capabilities include overlay measurement, pattern placement, defect inspection, overlay comparison, and auto-view field measurement. The wafer inspection can be conducted accurately and quickly using a wide range of inspection criteria including Level1, Level2, and Level3 based on ULK standard rules. ACCRETECH Win-Win 50-1600 also supports standard processes and technologies such as IMEC, Black-background, Dark-Background, HP-RGB, HP-RGBZ, and LEFT and RIGHT Gate. Win-Win 50-1600 also offers metrology capabilities such as profile measurement, scaling, tilt measurement, film thickness measurement, microdots/holes measurement, and pattern skew, which are necessary to evaluate mask features to ensure they meet industry standards. The machine also features defect inspection, which can detect a wide range of electrical, optical, and mechanical defects, including pitch, bridging, open/short, splitting, contact hole, pinhole, and rejects. ACCRETECH / TSK Win-Win 50-1600 is easy to integrate into production lines for improved throughput and quality. It offers outstanding performance and reliability thanks to its enhanced component architecture, flexible networking, and advanced power-saving features. It also supports a wide range of lenses and stage configurations to cater to the needs of different semiconductor products. Overall, TSK Win-Win 50-1600 is an ideal mask and wafer inspection tool for modern semiconductor factories looking for improved yields and defect reduction.