Used ACCRETECH / TSK Win-Win 50-1600 #9353792 for sale

ACCRETECH / TSK Win-Win 50-1600
ID: 9353792
Wafer Size: 12"
Vintage: 2005
Bright field inspection system, 12" 2005 vintage.
ACCRETECH / TSK Win-Win 50-1600 is a "mask & wafer inspection" equipment designed for automated inspection of etched patterns on photomasks, wafers, and other substrates. Comprised of a variety of advanced optical technologies, it enables high resolution, defect-free imaging and evaluation. TSK Win-Win 50-1600 utilizes a 4-channel CCD camera to capture images from a wide range of resolution levels. It can acquire up to 2000 frames per second, and its lens system offers 0.3 micron resolution and 6x adjustable zoom. Additionally, an Infrared (IR) laser and high-performance optics provide best-in-class imaging capabilities. Other notable features include: a Laser Scanning Wafer Assist Tool (LASWAF); an optional Character Mask Recognition unit, which can detect and identify defects in either A-sides or B-sides of masks; as well as a built-in alignment unit and data processing tools. The machine is well-suited for automated, accurate, and repeatable defect inspection, and provides fast result data output and reliable classification of pattern data. The user-friendly interface facilitates the setup process, and the tool is capable of high-end scanning and detection even in complex patterns. ACCRETECH Win-Win 50-1600 is highly customizable, as it can be outfitted with a variety of software packages including: WIN-Verity, the industry-leading image processing and software platform; VertexP2 software, its real-time visualization and analysis package; and other advanced tools. In addition, it can be used for both defect analysis and metrology applications, thanks to its built-in DIP, CMAPI, and ECD calculation capabilities. Overall, Win-Win 50-1600 is an impressive mask & wafer inspection asset designed to meet the ever-changing needs of the semiconductor industry. Its high resolution imaging, combined with advanced optics, IR laser, and a range of software packages, give it the capability to detect and identify defects from a wide range of patterns, making it an invaluable tool for quality control tasks.
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