Used ACCRETECH / TSK Win-Win 50-1600 #9373221 for sale

ACCRETECH / TSK Win-Win 50-1600 mask & wafer inspection equipment is an automated solution for inspecting photomasks and wafers used in the fabrication of semiconductor devices. The system is capable of detecting defects on the surface of a wafer or photomask with high precision and low noise. The unit is designed to provide critical process control points for a variety of applications including lithography, bond inspection, and edge inspections. It is equipped with an advanced high-magnification scanner which can detect microscopic defects and anomalies on the surface of the objects being inspected. In addition, TSK Win-Win 50-1600 can be configured with a real-time, direct-image overlay module which compares the wafer or photomask to a model or a reference sample with much greater accuracy than traditional image overlay systems. This allows for precise determination of process uniformity, accuracy, and quality consistency. The machine is also equipped with a versatile and powerful object recognition tool, which can quickly identify objects such as dies, pads, and other structures on the wafer or photomask. In addition, the asset can detect particles, spots, lines, voids, and other surface contamination and provide detailed information about each detected defect. ACCRETECH Win-Win 50-1600 is a highly reliable model featuring an intuitive interface and easy-to-operate functions. It can be set up and operated with minimal training and can support most major operating equipment platform formats including Windows and Linux. The system also contains a variety of safety features to ensure optimal operation. Win-Win 50-1600 is a capable tool for ensuring high quality results in the fabrication of semiconductor devices. With its high precision, low noise operation, and versatility, it is an ideal choice for automated inspection and defect detection of photomasks and wafers.