Used ACCRETECH / TSK Win-Win 50 #9202658 for sale

ACCRETECH / TSK Win-Win 50 mask and wafer inspection equipment is an essential tool used in the semiconductor fabrication process. The system is designed to provide rapid, accurate, and reliable mask and wafer inspection. Additionally, its modular design allows for easy customization, which makes it ideal for a wide range of applications. TSK Win-Win 50 can be used to inspect both die mask and photomask patterns. It utilizes TSK double sided optical unit to measure from both the top and the bottom of the wafer, providing a higher accuracy than single sided optical systems. Its high magnification and speed also make it well suited for microscopy and topographical inspection. The machine is powered by an advanced image acquisition and analysis tool, incorporating high speed image processing, pattern recognition technology, and a specially developed search engine. Its advanced optics also ensure high throughput and accuracy. The imaging asset is also fully automated, allowing for efficient and repeatable inspection. ACCRETECH WIN WIN 50 is also capable of defect classification with its built-in classification tools. It can distinguish between real defects and false positives, making it an effective tool for process optimization. Additionally, its intuitive software packages allow for easy training and model setup. The equipment also supports many standard data formats, allowing for easy integration into any existing workflow. Overall, ACCRETECH / TSK WIN WIN 50 system is an ideal choice for any semiconductor production line. Its high speed, accuracy, and wide range of applications make it a reliable and cost-effective choice for mask and wafer inspection. Its modular design also allows for easy customization and integration, making it a versatile and flexible choice in any production setting.