Used ACCRETECH / TSK Win-Win 50 #9281217 for sale

ACCRETECH / TSK Win-Win 50 is a mask & wafer inspection equipment used in semiconductor production, which allows for the inspection of substrates and masks in high resolution with a wide field of view. The system utilizes a direct imaging projection unit and an optically-modified, waffle-type objective lens to ensure a clear, or "transparent", image of the specimen with no distortion. TSK Win-Win 50 can detect a variety of pattern characteristics, such as fine line widths, line edges, circuit shapes, and shapes of printed layer patterns, as well as surface defects. In addition, the machine is equipped with an advanced, high-speed scanning tool that supports high throughput. It is capable of quickly acquiring a variety of substrates and masks with a scanning field of up to 24.6 x 17.9 mm. It also features a high-resolution imaging asset to detect minute processing defects with excellent image quality. ACCRETECH WIN WIN 50's software supports the precise evaluation of pattern characteristics, defects, and defects' positional information with automatic image analysis algorithms. Furthermore, the model can support both manual and automatic operations for various substrate materials such as glass, silicon, metal, and crystals. WIN WIN 50 is ideal for a wide range of applications in semiconductor production, including surface inspection, LCD mask-related defect inspection, pattern inspection, and wire board pattern inspection. It is also equipped with an intuitive user interface, and its easy-to-use operation and maintenance functions enable efficient mask & wafer inspection. In summary, ACCRETECH Win-Win 50 is an innovative and reliable mask & wafer inspection equipment. Its direct imaging projection system and advanced, high-speed scanning capability provide excellent image quality and performance for a variety of substrate materials. Furthermore, its versatile software and intuitive user interface make it suitable for a wide range of semiconductor production applications.