Used ADE / KLA / TENCOR AWIS Constellation #9190875 for sale

ADE / KLA / TENCOR AWIS Constellation is a mask and wafer inspection equipment designed for semiconductor production. It is a tool used to analyze various wafer geometries, defects, and other features. The system uses automated defect review, wafer verification, process control, and defect review capabilities to ensure a high level of accuracy. The unit consists of a high resolution, automated inspection machine, ADE AWIS Constellation Platform, and a variety of tools to enable data analysis. KLA AWIS Constellation Platform is a high-speed scanning tool that can inspect high-end features in order to detect and measure any defects that may be present. The asset is capable of detecting small defects on the wafer surface, such as sub-micron defects, as well as any features that are not in line with the design pattern. With TENCOR AWIS Constellation Platform, the model performs automated defect review, wafer verification, balance analysis, and defect verification, providing users with highly detailed information about the defects within the wafer. The equipment also includes a web-based web browser tool that enables users to quickly compare, interpret, and share the results. The system also includes a library of spectral samples, which can be used to predict future defects based on their behavior and occurrence. The unit can also use predefined model spectral profiles to detect and characterize hard-to-find features and anomalies. Additionally, the machine provides metrics for defect despiking, defect inspection, defect level control, and defect feature detection and measurement. For advanced users, the tool includes an advanced feature set that supports 3D mask inspection and wafer inspection, featuring multiple illumination angles, automated defect classification, and particle defect analysis, and defect 3D reconstruction. Finally, the asset is compatible with a range of semiconductor device fabrication processes, making it an all-in-one mask and wafer inspection solution for a broad range of device fabrications. Additionally, the model is certified and has earned global industry acceptance. With its comprehensive feature set, AWIS Constellation is a valuable tool for managing and inspecting wafer characteristics during the semiconductor device manufacturing process.