Used ADVANCED METROLOGY SYSTEMS (AMS) IR3000 #9383425 for sale

The ADVANCED METROLOGY SYSTEMS (AMS) ADVANCED METROLOGY SYSTEMS (AMS) IR3000 is a state-of-the-art mask and wafer inspection equipment designed for the high-accuracy measurement and analysis of thin films, metals, insulators, and other substrate materials used in the semiconductor and related industries. IR3000 provides both contact and noncontact measurements of thick or thin film layers and can provide measurements for various types of geometries including round and oblong shapes. ADVANCED METROLOGY SYSTEMS (AMS) IR3000 features an integrated, automated wafer and specimen handling system with a high-resolution microscope and Process Control Unit providing a fully automated inspection process. Its streamlined software interface supports both manual and automated operations and includes operational functions such as calibration, data acquisition, data analysis, and reporting. IR3000 also offers a wide array of automated measurement capabilities including optical measurements of thickness, reflectivity, resistivity, and wavefront errors. The AMS ADVANCED METROLOGY SYSTEMS (AMS) IR3000 is equipped with high-precision, autofocus optics providing accurate measurements of up to 6 particles per μm feature sizes. The unit is capable of measuring the smallest of features accurately and repeatably. Its sophisticated optics machine also provides powerful analytical capabilities for measuring localized features such as discretes and vias. IR3000 incorporates a high-power laser imaging tool that can detect and image defects of an array of materials from 140nm and larger. Its advanced imaging capabilities enable users to zoom into images of live (or real-time) atomistic images of structures providing unprecedented detail on the microscopic scale. ADVANCED METROLOGY SYSTEMS (AMS) IR3000 is designed to provide consistent and uniform performance in both clean and contaminated environments. Its robust design provides superior performance in harsh environmental conditions and guarantees the highest quality results in all tests. Its dynamic metrology capabilities include the ability to measure and quantify misalignment, well-proportioned topography, and profile measurements with extreme accuracy. As a versatile and reliable tool, the AMS IR3000 is an ideal choice for laboratories, R&D institutes, and companies that require precise, repeatable measurements in the research and production of microelectronic components and devices. By providing high-precision measurements of a variety of materials and the ability to comprehensively analyze microscopic features, ADVANCED METROLOGY SYSTEMS (AMS) IR3000 is an excellent choice for the rigorous analysis and quality control of semiconductor components.