Used AEM-EVERTECH TTR-300I #9234973 for sale

AEM-EVERTECH TTR-300I is an advanced mask and wafer inspection equipment used to check for defects and irregularities in etching, lithography and patterning of microelectronic circuits. This system is capable of performing high-precision inspections in a fraction of the time that it takes to scan an entire chip, thus allowing its users to detect and quantify production defects before they become costly issues. TTR-300I is a combination of hardware and software-based automated inspection tools allowing quality control engineers and other personnel to easily and quickly identify and quantify defects in critical production stages. This unit is equipped with a state of the art 1024x1024 pixel laser detection and focusing machine that can accurately detect particles and defects from the surface of the mask or wafer. Additionally, the tool provides automated optical zoom and spot magnification so that the user can investigate defects with magnified accuracy. AEM-EVERTECH TTR-300I has a custom software package tailored for the specific user's specifications that can be customized for different production tasks. The software allows the user to configure and monitor the asset, select layout criteria and track the inspection model's performance. This software also has an inbuilt statistical analysis feature for comprehensive defect reporting. TTR-300I is designed to accommodate a wide range of sample sizes and configurations in a single platform. The integrated input stage produces high contrast images for optimal viewing and provides a wide range of Field-of-Views (FOV) for the user to choose from. The equipment's custom mask and wafer holders provide a high level of sample stability during the inspection process, while the computer controlled x-y stages allow for sample movement or viewing during nonstandard inspections. The built-in filters on AEM-EVERTECH TTR-300I enable the user to select one sample type or the other, and the custom image processing tools allow the user to image corrections or adjustments to the image. TTR-300I is one of the best mask and wafer inspection systems available today. With its state of the art hardware and software customizable features, AEM-EVERTECH TTR-300I can help its users detect and quantify production defects with remarkable accuracy in a time efficient manner. This inspection system can provide a great wealth of knowledge regarding the overall quality of production and can help many industries save time, money, and resources.