Used ALLTEQ LFI 3000 #9028592 for sale

ALLTEQ LFI 3000 is a next-generation mask and wafer inspection equipment designed to deliver high-resolution, real-time defect inspection and analytics. This system is optimized for maximum performance, providing users with maximum throughput and fast defect detection. To ensure the highest resolution and accuracy, the unit is equipped with two-dimensional imaging CMOS sensors, a high-powered 4-Laser source object detection machine, and an optimized optical tool. This provides users with easy and precise wafer and mask feature analysis. LFI 3000 has a large area scan of up to 1.5 cm² and can cover an area of up to 6 cm² at a resolution up to 16 µm up to 128x512 resolution. This asset also features a high-density pattern measurement, robust pattern orientation calculation, high switching speed for high precision defect analysis, and a wide range of defect detections, including particles and scratches. The model can be easily customized and integrated, allowing for simple installation and setup. It also includes intuitive software for easy navigation and user experience. The intuitive GUI allows for fast inspection and analysis of defect-free results quickly. Moreover, the equipment offers a number of integrated capabilities, such as data storage, advanced analysis and data export functions, an automated post-and-analyze defect inspection system, and a tracking unit for defect patterns. This allows users to analyze defects, quickly isolate problem areas, and provide reliable solutions for repairs or defect reduction. ALLTEQ LFI 3000 is a powerful tool to Inspecting and Debugging wafer and mask features, optimizing defect detection, and making accurate defect identification and solutions more efficient. This machine is the perfect solution for user looking for advanced mask and wafer inspection capabilities.