Used ALLTEQ LFI 3010 #9266249 for sale

ALLTEQ LFI 3010 is a versatile automated mask and wafer inspection solution designed to improve quality assurance for semiconductor manufacturing. With its advanced optical metrology equipment, LFI 3010 not only detects defects on a wide range of substrates, but also measures critical structures on the mask itself. The system uses advanced image processing and mosaic techniques to create a continuous full-field of view with no stitching or repetition. This enables a single scan of the entire layer or field for rapid and accurate defect detection, measurement, and characterization. ALLTEQ LFI 3010 also features a unique combination of microresolution and macroresolution imaging capabilities. At the microlevel, the unit utilizes advanced back-scattering images to identify and measure under-layer defects and critical structures on fine-grained structures. At the macrolevel, a combination of contrast and back-scattering images is used to identify and measure surface defects, such as pinholes, on a wide range of substrates. In addition, the machine is equipped with a fully automated defect classification process to quickly and accurately identify defect types, their size, shape, and other characteristics. This can be used to trigger an appropriate failure analysis methodology to identify and troubleshoot issues in the production line. Overall, LFI 3010 is an efficient and reliable mask and wafer inspection tool with an impressive range of capabilities. With its advanced imaging and defect classification algorithms, the asset is capable of detecting and measuring a wide range of defects and blemishes with ease. Furthermore, its automated defect classification process simplifies and streamlines the defect analysis process, leading to increased efficiency in production lines.