Used AMAT / APPLIED MATERIALS 0020-1412 #9361620 for sale

AMAT / APPLIED MATERIALS 0020-1412 is an advanced mask and wafer inspection equipment that is designed to quickly and accurately identify defects on semiconductor photomasks and wafers. The system incorporates high-resolution optical imaging and advanced automated image analysis software to detect and characterize defects. It is capable of inspecting up to 30 wafers per hour and can detect defects as small as 1 micron. The unit consists of four components: the light source, the optical inspection head, the mask or wafer stage, and the image analysis software. The light source emits a diffused illumination that is adjustable for different inspection conditions. The optical head consists of a long-working-distance microscope, a high-resolution camera, and a lens machine that allows for a very wide field of view and high-magnification capabilities. The mask or wafer stage is designed with a precision motorized XY scanning tool, which allows for very accurate, high-resolution scanning of the sample. Finally, the image analysis software consists of defect detection and characterization algorithms that are programmed to detect and classify defects. This software is capable of analyzing the images and giving a detailed report of any defects it finds. It can also perform multiple analysis tasks such as quantitative analysis, defect location mapping, dual indexing, and computing feature sizes. The asset also comes with a graphical user interface (GUI) that is designed to provide users with easy control over the model parameters and settings. The GUI also allows users to review the data and images acquired by the equipment. Overall, AMAT 0020-1412 is a powerful and advanced mask and wafer inspection system that combines high-resolution imaging, precise motorized scanning, and advanced software algorithms to quickly and accurately detect defects on semiconductor photos and wafers. The unit is easy to use and can help improve production yields and reduce costs.